European Symp. on Reliability of Electron Devices, Failure Physics and Analysis>

Committees > Organization

Conference Chair & Vice-Chair
N. NOLHIER LAAS-CNRS, University of Toulouse (France)
G. BASCOUL CNES (France)
 
Technical Program Chairs
H. FREMONT IMS, University of Bordeaux (France)
N. LABAT IMS, University of Bordeaux (France)
F. MARC IMS, University of Bordeaux (France)
 
Industrial Exhibition
G. BASCOUL CNES (France)
C. SEBASTIEN  University of Toulouse (France)
 
Workshop
R. RONGEN NXP Toulouse (France)
 
Journal Edition Chairs
G. BASCOUL CNES (France)
N. LABAT IMS, University of Bordeaux (France)
N. NOLHIER LAAS-CNRS, University of Toulouse (France)
 
Organization Secretariat and Webmaster
C. SEBASTIEN  University of Toulouse (France)
 
Audio/Video
TBD  
TBD  
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