Committees > Technical Program
| Technical Program Chairs |
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| Guillaume BASCOUL |
CNES Toulouse (France) |
| Hélène FREMONT |
IMS, University of Bordeaux (France) |
| Nathalie LABAT |
IMS, University of Bordeaux (France) |
| François MARC |
IMS, University of Bordeaux (France) |
| Nicolas NOLHIER |
LAAS-CNRS, University of Toulouse (France) |
| |
| Sub-committee Chairs |
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Topic A: Quality and Reliability assessment techniques and methods for Devices and Systems
|
| Edgar OLTHOF |
NXP (Netherlands) |
| Cora SALM |
University of Twente (Netherlands) |
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Topic B: Semiconductor Failure Mechanisms & Reliability for Si technologies & Nanoelectronics
|
| Alain BRAVAIX |
IM2PN-CNRS, ISEN (France) |
| Eckhard LANGER |
Globalfoundries (Germany) |
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Topic C: Progress in Failure Analysis: Defect Detection and Analysis
|
| Julien GOXE |
NXP (France) |
| Giovanna MURA |
University of Cagliari (Italy) |
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Topic D: Reliability of Microwave devices and circuits
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| Michael DAMMANN |
Fraunhofer IAF (Germany) |
| Jean-Guy TARTARIN |
LAAS-CNRS, University of Toulouse (France) |
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Topic E: Packaging and Assembly Reliability and Failure Analysis
|
| Paolo COVA |
University of Parma (Italy) |
| Alexandrine GUÉDON-GRACIA |
IMS, University of Bordeaux (France) |
| René RONGEN |
NXP (France) |
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| F : Power Devices and Electronic System : Reliability and Failure Analysis |
Topic F1: Smart-power devices, IGBT, Thyristors
|
| Mauro CIAPPA |
ETH Zurich (Switzerland) |
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Topic F2: SiC and GaN power devices
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| Matteo MENEGHINI |
University of Padova (Italy) |
| Loic THEOLIER |
IMS, University of Bordeaux (France) |
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Topic F3: Power Electronic System
|
| Francesco IANNUZZO |
University of Aalborg (Denmark) |
| Hong LI |
University of Beijing Jiaotong (China) |
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Topic G: Photonics Reliability
|
| Yannick DESHAYES |
IMS, University of Bordeaux (France) |
| Stéphane MARIOJOULS |
Airbus (France) |
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Topic H: MEMS and sensors Reliability
|
| Pierre BLONDY |
XLIM, University of Limoges (France) |
| Christophe POULAIN |
CEA, LETI (France) |
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| I : Extreme environments and Radiation |
Topic I1: ESD-EOS, Latchup
|
| Fabrice CAIGNET |
LAAS-CNRS, University of Toulouse (France) |
| Philippe GALY |
STMicroelectronics (France) |
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Topic I2: EMC-EMI (integrated circuits, power electronic systems)
|
| Tristan DUBOIS |
IMS, University of Bordeaux (France) |
| Fabrice CAIGNET |
LAAS-CNRS, University of Toulouse (France) |
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Topic I3: Radiation impact on circuits and systems reliability
|
| Olivier CREPEL |
AIRBUS (France) |
| Francesco PINTACUDA |
STMicroelectronics (Italy) |
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